Fajardo Jaimes A. Comparative analysis of threshold voltage extraction techniques based in the MOSFET gm/ID characteristic. Tecnura [Internet]. 1 de abril de 2017 [citado 18 de abril de 2024];21(52):32-44. Disponible en: https://revistas.udistrital.edu.co/index.php/Tecnura/article/view/9466