FAJARDO JAIMES, Arturo. Comparative analysis of threshold voltage extraction techniques based in the MOSFET gm/ID characteristic. Tecnura, [S. l.], v. 21, n. 52, p. 32–44, 2017. DOI: 10.14483/udistrital.jour.tecnura.2017.2.a02. Disponível em: https://revistas.udistrital.edu.co/index.php/Tecnura/article/view/9466. Acesso em: 18 abr. 2024.